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ASA-Chip Proving Test

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Description

        ASA-CPT-FA12/FA08 is a device designed and manufactured by our company, mainly for wafer CP testing in wafer manufacturing. This equipment adopts needle contact test, which can provide multiple adjustable test pins and probe holders; the test machine is directly linked with the probe table, so that the grains on the wafer are in contact with the probe in turn, and the signal output from the test machine is accurately delivered to the wafer surface, which is completed quickly and efficiently, and various electrical and optical efficiency parameters are tested on the chip, which automatically completes the screening of the production yield and efficiency of the chip, and then helps the subsequent production of the chip to use Improve quality and efficiency.

Peculiarity

1,High efficiency and high precision testing with a running speed of over 200mm/s.
2, support for single-point and continuous testing.
3, test box and machine directly connected to the automatic control, fast switching test needle card.
4, fully automatic control system, test software simple and efficient.

Applicable:

Automatic inspection of 4/6/8/12″ wafers

Technical

Product Name

ASA-CPT

Product Model

FA12/FA08

Wafer Specifications

6 / 8 / 12 inches . Thickness 300-1000㎛

Die Size

300-76000㎛

Equipment travel

X:0-350mm;Y:0-800mm,Z:0-70mm

Device accuracy/resolution

X Y Z ≤2㎛   /   0.1㎛

XYZ axis maximum running speed

260mm/s

Theta Parameters

Range: ±5° / Accuracy 0.001°

Machine size

2*1.8*1.8m(length, width and height)

Machine weight

2600kg

 

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